Memory testing shortcuts lead to ... bad memory in the market.

[dunbar]

Was just surfing EE Times, wanted to post this in the news section but the submit news link seems to be hosed.....

EETimes.com - Industry hit with memory failures, 'techno-stress'

That link is to a recent discussion of DRAM and NAND types that have been stated as failing inordinately (and with few manufacturer names given).


The article quotes G. Dan Hutcheson, president of VLSI Research Inc.: "The reason for the memory failures is that OEMs, test houses and chip makers have cut back--or taken shortcuts--on the memory test process in an effort to cut costs,..."


Hit the link for more, but don't expect too much. The referenced study seems to reference years old articles, so this might be crying wolf.